平面度测量  制造商、经销商、供应商

Interferometric measuring systems for non-contact flatness measurement of finish-machined parts.
TOPOS interferometers operate according to the principle of grazing incidence of light. The flatness of also rougher parts can be measured, which show no more fringe pattern with optical flats or Fizeau-interferometers. Next to lapped or ground parts also polished parts can be measured.

By default, TOPOS flatness measuring instruments are available with two different sizes of measuring field: with a diameter of 100mm or 50m. An adaptation towards special sizes is possible according to request.

The parts may consist of diverse materials:

Examples of application areas:

在测量表面平整度和评估形状参数时，可使用非接触式测量技术，如使用白光干涉测量法的相干扫描干涉仪，在大视野范围内进行测量，避免忽略缺陷的风险。通过在几分之一秒内捕捉数百万个测量点，光学平面度测量可确保对整个表面进行可靠的检测，从而在生产的早期阶段就能发现并找出有缺陷的部件。由于要检测的表面不会变形，因此即使是在柔软或非常脆弱的试样上也能进行可靠的平面度评估。光学表面平面度测量是质量控制或生产中 100% 检测的理想选择。